Product Introduction
The XQ20-GI laser plane interferometer is mainly used for flatness measurement of precision optical planes, micro wedge angle measurement of optical plates, measurement of uniformity of optical materials, and configuration of corresponding worktables it can measure the wave-front error of optical sheets. It is an optical inspection instrument necessary for optical component processing plants and optical instrument manufacturers.
This type of instrument adopts large studio mobile detection scheme to solve the problem of large-diameter high-precision Graphic processingOnline inspection. The use of invisible curtain-type coaming plate can not only ensure theneed of high-precision but also realize the large-diameter work plate flow in large-scale production workshop for fast screening measure. Using high-resolution camera system and display system, reducing the labor intensity of the operator, the detection is intuitive and convenient; using economical and reasonable simplified structure, not only ensures the measurement accuracy of the instrument but also reduces the manufacturing cost,it provides a good condition for non - contact quick measurement in low and medium precision mass production plant.
Technical parameters
1. The first standard plane (A side), the working diameter D1 = Φ200mm, PV<0.045μm (λ/15)
2. The second standard plane (B side), the working diameter D2 = Φ200mm,PV<0.045μm (λ/15)
3. Collimation system..............................Working diameter Φ200mm, focal length f = 580mm, wave aberration <λ/15
4. Studio size..............................1100×1100×350mm measurable range 800mm×800mm (mobile)
5. Light source specifications.................................... Laser ZN250 (He-Ne) (632.8 nm).
6. Dimensions of the instrument.................................... 1400×1250×1560mm (height)
7. Weight..........................................500kg
