On the Basis of Retaining the Original Functionalities and Characteristics of the XQ15-GI Laser Plane Interferometer, its Practicality and Application Scope have been Significantly Enhanced.
Purpose
Technical Parameters
This Instrument is Suitable Not Only for Production Workshops in Mass Production Units and for Measuring Flatness and High-Precision Parallelism (Angles), but Also Particularly for Rapid Screening Applications on Production Lines of Large-Scale Flat Surfaces.